Authors: Mersaydes L. Goodson, Richard Lagle and Padmaja Guggilla.
In this paper, X-ray Photoelectron Spectroscopy (XPS) measurements were obtained to determine the chemical structure of these polystyrene (PS) doped and undoped thin films. The purpose is to analyze the graphs and binding energies of each element to determine. The XPS analysis of these pure PS compared doped PS thin film does show a tunable potential for optimum properties. PS has a relative basic host matrix, and it is our hypothesis that first, we can show that XPS can be a useful and resourceful tool in characterizing these thin films for chemical structure and binding information. Secondly, we intend to show that through the addition of dopants, we can affect the binding energies. The results show the impact on O1s binding energies ± 4.43-5.57 eV and for C1s ± 1.45 -9.37 eV. These analyses have been performed in several studies on polymer nanocomposite materials. Here, we introduce the use of the XPS analysis in recent notable polymer nanocomposite studies for various target applications.
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