Microbiology & Infectious Diseases
Open AccessAntimicrobial Resistance Profiles of Bacterial Contaminants at a Tertiary Hospital in Kenya Reveal Critical Infection Risks and Urgent Need for Enhanced IPC Measures
Authors: Kolek Chester, Briton M. Kavulavu, Faith Okalebo, Benson Singa, Mary Masheti, Ian Omuom, Ochieng Odhoch, Chris Oduol, Robert Musyimi, Caroline Tigoi.
Abstract
Hospital-acquired infections (HAIs) remain one of the most prevalent adverse events among hospitalized patients, significantly impacting patient outcomes and healthcare systems. A major contributing factor to HAIs is the high contamination rate of hospital environments with pathogenic bacteria. The risk of HAIs is exacerbated when surface contaminants are antimicrobial-resistant (AMR) pathogens, which complicates treatment strategies and increases patient morbidity. The need to characterize the AMR profiles of bacterial contaminants in hospital settings is critical for the effective implementation of Infection Prevention and Control (IPC) measures. This study aimed to determine the AMR patterns of bacterial contaminants isolated from high-frequency surfaces in a tertiary hospital in Kenya. A total of 62 surface swabs were collected in April 2020 from various hospital departments, including gynecology, pediatric, newborn, and renal units, and cultured using standard microbiological techniques. The bacterial isolates were further screened for AMR using laboratory-based assays. Of the 62 swabs, 61.3% (n=38) yielded bacterial growth, from which 46 isolates were identified. Gram-negative bacteria accounted for 86.96% (n=40) of the isolates, with Acinetobacter spp. being the most prevalent (41.3%). Resistance markers were detected in 36.96% (n=17) of the isolates, with Acinetobacter spp. exhibiting the highest resistance rate (36.84%). These findings underscore the urgent need for stringent adherence to IPC protocols and continuous surveillance, along with genomic studies to trace the transmission dynamics of AMR pathogens within hospital environments.
View / Download PDFEditor-in-Chief
View full editorial board →